A Traceable Method for the Arc-free Characterization and Modeling of CDM testers and Pulse Metrology Chains

Gieser, H.A.H.A.GieserWolf, H.H.WolfSoldner, W.W.SoldnerReichl, H.H.ReichlAndreini, AntonioAntonioAndreiniNatarajan, Mahadeva IyerMahadeva IyerNatarajanStadler, WolfgangWolfgangStadler2022-03-102022-03-102004https://publica.fraunhofer.de/handle/publica/347098A traceable low-voltage network analysis in the time and frequency domain is introduced for the arcfree characterization of CDM testers and their metrology chains. An improved tester circuit model is derived from step responses.en621A Traceable Method for the Arc-free Characterization and Modeling of CDM testers and Pulse Metrology Chainsconference paper