Maack, T.T.MaackNotni, G.G.NotniSchreiber, W.W.Schreiber2022-03-092022-03-091994https://publica.fraunhofer.de/handle/publica/322162A system for three-coordinate measurement will be presented which is suitable for the contouring of rough surface objects.The system is based on the combination of the methods of source transformation and wavelength shift.This makes it possible to illuminate and to view the object without shading. The generation of a synthetic wavelength by suitably choosing the difference of the wavelengths allows a variable sensitivity and hence an adjustment to the contour to be measured.The maximum accuracy of the system will be stated.First results with objects having a diameter of less than 5 cms will be shown.decontouringFormvermessungoptical three-coordinate measurementoptische 3D-Koordinatenmessungrauhe Oberflächerough surfacespecklespeckle-Interferometriespeckle interferometrytwo-source methodtwo-wavelength methodZwei-Quellen-MethodeZwei-Wellenlängen-Methode620conference paper