Gottschalg, R.R.GottschalgRommel, MathiasMathiasRommelInfield, D.G.D.G.InfieldKearney, M.J.M.J.Kearney2022-03-092022-03-091998https://publica.fraunhofer.de/handle/publica/332152enamorphous siliconcharacterizationevaluation670620530Applicability of parametric models for amorphous silicon modules and cellsconference paper