CC BY 4.0Kutz, J.J.KutzLiebermeister, LarsLarsLiebermeisterVieweg, N.N.ViewegWenzel, KonstantinKonstantinWenzelKohlhaas, RobertRobertKohlhaasNaftaly, M.M.Naftaly2023-03-162023-03-162022https://publica.fraunhofer.de/handle/publica/437717https://doi.org/10.24406/publica-105210.3390/app1216825710.24406/publica-1052We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using atmospheric water vapour lines and a silicon wafer etalon; the amplitude linearity is verified using a set of silicon plates. Instrument performance is tested by measuring transmission properties of a variety of representative samples and comparing with a time-domain spectrometer and a frequency-domain spectrometer.enfast-sweeping FDScalibrationperformance testcomparative measurementsterahertz spectroscopyjournal article