Mixed-level test generation for synchronous sequential circuits using the FORGBUSTER-algorithms

Gläser, U.U.GläserVierhaus, H.T.H.T.Vierhaus2022-03-032022-03-031996https://publica.fraunhofer.de/handle/publica/18953510.1109/43.494704en005006629Mixed-level test generation for synchronous sequential circuits using the FORGBUSTER-algorithmsjournal article