Analysis of the Reliability of Ferroelectric Field Effect Transistors in Combination with Crossbar Circuits for Neuromorphic Computing

Kämpfe, ThomasMessaris, IoannisHoffmann, TudorTudorHoffmann2022-03-072022-03-072020https://publica.fraunhofer.de/handle/publica/283501en621Analysis of the Reliability of Ferroelectric Field Effect Transistors in Combination with Crossbar Circuits for Neuromorphic Computingdiploma thesis