Under CopyrightJambreck, Joachim D.Joachim D.JambreckRommel, MathiasMathiasRommelRichter, ChristophChristophRichterWeinzierl, PhilipPhilipWeinzierlBauer, A.J.A.J.BauerFrey, LotharLotharFrey2022-03-1124.7.20122012https://publica.fraunhofer.de/handle/publica/37622810.24406/publica-fhg-376228enfabricationapplicationshielded probesconductive AFMmeasurementsatomic force microscopecAFMTUNAtunneling AFM670620530Fabrication and application of shielded probes for conductive AFM measurementsposter