Raman scattering as a quantitative tool for residual acceptor assessment in semi-insulating GaAs

Kaufmann, U.U.KaufmannSeelewind, H.H.SeelewindWagner, J.J.Wagner2022-03-022022-03-021986https://publica.fraunhofer.de/handle/publica/17394810.1063/1.96594enAkzeptorGaAs(semiisolierend)Ramanstreuung621667Raman scattering as a quantitative tool for residual acceptor assessment in semi-insulating GaAsjournal article