Tang, Z.Z.TangGross, H.H.Gross2022-05-062022-05-062021https://publica.fraunhofer.de/handle/publica/41613210.1364/OE.439873In part I [Opt. Express 29, 39967 (2021) [CrossRef] ] of this publication, the working principle of a mixed ray-tracing (MRT) method is introduced for surface-decomposed transverse aberration contributions, and the settings and various calculation options are discussed. Following part I, this paper is a supplement with the evaluation of the calculation results and more illustrations of practical applications, which focuses on the support of the MRT method during the symmetry-free optical system design process. The comprehensive analysis of a group of lithography systems as an application example proves that the MRT method is a powerful tool for imaging system performance assessment, as well as for relative sensitivity analysis among the surfaces in the optical system.en620621journal article