Wieberneit, M.M.WieberneitLackmann, R.R.Lackmann2022-03-082022-03-081993https://publica.fraunhofer.de/handle/publica/321320This paper deals with a nematic liquid crystal between line structure and backplate electrode. Experimental results for an optimum spatial resolution including a simple model will be presented providing new preparation method and analysis technique for digital circuits.enAuflösungsvermögenDAP-EffektDEBUG-TestmethodeDoppelbrechungdouble refractionECB-Effektelectrooptical systemelektrooptisches SystemFlüssigkristallbauelementFunktionsprüfungintegrated circuitintegrierte SchaltungMikroskopieMolekularrotationoptische Anisotropieoptische DrehungTesten621New results of field-induced deformation of nematic liquid crystals for testing of digital integrated circuitsconference paper