Birkmann, B.B.BirkmannSalcianu, C.C.SalcianuMeissner, E.E.MeissnerHussy, S.S.HussyFriedrich, J.J.FriedrichMüller, G.G.Müller2022-03-032022-03-032006https://publica.fraunhofer.de/handle/publica/21002410.1002/pssc.200564119en670620530Characterisation of the electrical properties of solution-grown GaN crystals by reflectivity and Hall measurementsjournal article