Blom, S.S.BlomDeiß, T.T.DeißIoustinova, N.N.IoustinovaKontio, A.A.KontioPol, J. van deJ. van dePolRennoch, A.A.RennochSidorova, N.N.Sidorova2022-03-102022-03-102007https://publica.fraunhofer.de/handle/publica/35673010.1007/978-3-540-70881-0_11en004400TTCN-3 for distributed testing embedded softwareconference paper