Lutz, G.G.LutzBergmann, H.H.BergmannHoll, P.P.HollManfredi, P.F.P.F.ManfrediButtler, W.W.ButtlerHosticka, B.J.B.J.HostickaZimmer, G.G.Zimmer2022-03-082022-03-081986https://publica.fraunhofer.de/handle/publica/314344Design considerations for low noise charge measurement and their application in CMOS electronics are described. The amplifier driver combination whose noise performance has been measured in detail as well as the analog multiplexing silicon strip detector readout electronics are designed with low power consumption and can be operated in pulsed mode so as to reduce heat dissipation even further in many applications. (IMS)en621Low noise monolithic CMOS front end electronicsconference paper