Salzer, R.R.SalzerGraff, A.A.GraffSimon, M.M.SimonAltmann, F.F.Altmann2022-03-042022-03-042010https://publica.fraunhofer.de/handle/publica/22378810.1017/S1431927610061787en620502Quantitative assessment of TEM-sample warping caused by FIB preparationjournal article