Barowski, J.J.BarowskiJebramcik, J.J.JebramcikWagner, J.J.WagnerPohl, N.N.PohlRolfes, I.I.Rolfes2022-03-142022-03-142019https://publica.fraunhofer.de/handle/publica/40755410.1109/IMWS-AMP.2019.8880121This contribution presents a methodology and a measurement setup for spatially resolved material characterization. For this purpose, calibrated millimeter-wave (mmWave) frequency modulated continuous wave (FMCW) radar systems, operating up to 250 GHz, are utilized. The calibration scheme allows for a systematic error correction comparable to a vector network analyzer (VNA). A synthetic aperture radar (SAR) measurement is used to generate a focused 3-dimensional image with very high resolution. A precise spatial distribution of the material parameters is obtained by a novel combination of the imaging and material parameter extraction algorithms.en621conference paper