Shan, JieJieShanMichaelsen, EckartEckartMichaelsenStilla, UweUweStillaSu, FenzhenFenzhenSu2022-03-062022-03-062020https://publica.fraunhofer.de/handle/publica/26570110.1109/JSTARS.2020.3028483en004620670Foreword for the Special Issue on Advances in Pattern Recognition in Remote Sensingjournal article