High Minority Charge Carrier Lifetimes in Crystalline Silicon - Auger, Radiative and Surface Recombination

Niewelt, TimTimNiewelt2023-06-202023-06-202022Note-ID: 0000920Ahttps://publica.fraunhofer.de/handle/publica/443098enHigh Minority Charge Carrier Lifetimes in Crystalline Silicon - Auger, Radiative and Surface Recombinationpresentation