Niewelt, TimTimNiewelt2022-03-142022-03-142018https://publica.fraunhofer.de/handle/publica/405931enMaterial- und ZellcharakterisierungPhotovoltaikSilicium-PhotovoltaikCharakterisierung von Prozess- und Silicium-Materialien621697Analysis of Defect Recombination Based on Shockley-Read-Hall Statistics - Where we com from: The DPSS Approachpresentation