Jenihhin, Maksim2023-09-062023-09-062023979-8-3503-3278-0979-8-3503-3277-3https://publica.fraunhofer.de/handle/publica/45032110.1109/DDECS57882.2023en26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023. Proceedings