Biccari, Leonardo diLeonardo diBiccariBoroni, AndreaAndreaBoroniCastelnovo, AlessandroAlessandroCastelnovoZullino, LuciaLuciaZullinoCerati, LorenzoLorenzoCeratiWolf, HeinrichHeinrichWolfWeber, JohannesJohannesWeberAndreini, AntonioAntonioAndreini2022-03-142022-03-142020https://publica.fraunhofer.de/handle/publica/409767Alternative CDM methods show a good correlation with Field Induced CDM on failing peak current for products not affected by recovery effects. Methods correlation using HV technologies impacted by Forward Recovery Effects, considering multiple DUT impedance variations and rise time impact, is investigated by means of characterizations and TCAD simulations.enESDCDMCC-TLPForward Recovery Effect621Impact of Alternative CDM Methods on HV ESD Protections Behaviorconference paper