Zander-Nowicka, J.J.Zander-NowickaMarrero Perez, A.A.Marrero PerezSchieferdecker, I.I.SchieferdeckerDai, Z.R.Z.R.Dai2022-03-102022-03-102007https://publica.fraunhofer.de/handle/publica/356408en004Test design patterns for embedded systemsconference paper