Wunderle, B.B.WunderleMay, D.D.MayAbo Ras, M.M.Abo RasSheva, S.S.ShevaSchulz, M.M.SchulzWöhrmann, M.M.WöhrmannBauer, J.J.BauerKeller, J.J.Keller2022-03-132022-03-132016https://publica.fraunhofer.de/handle/publica/39680910.1109/THERMINIC.2016.7749057We have developed a novel, rapid, robust and non-destructive experimental technique for in-situ monitoring of delamination of interfaces for electronic packages. The method is based on a simple thermal transducer matrix of so-called THIXELS (thermal pixels) which allows a spatially resolved real-time image of the current status of delamination. The transducers are small metal wire meanders which are driven and electrically read out using the well-known 3-omega method. This method has special advantages over other thermal contrast methods with respect to robustness, sensitivity and signal-to-noise ratio. Notable is the absence of cross-effects. The proof of concept has been furnished on an industry-grade flip-chip package with underfill on an organic substrate. The technique is especially powerful for buried interfaces, where time-honoured methods like scanning acoustic microscopy (SAM) cannot be applied. As the technique effectively performs a thermal diffusivity sensitive scan, it may not only be useful for stress testing during package qualification, but sensor applications on other fields of health monitoring seem also possible.en621In-situ monitoring of interface delamination by local thermal transducers exemplified for a flip-chip packageconference paper