Krone, T.T.KroneHung, L.D.L.D.HungJung, M.M.JungMertens, A.A.Mertens2022-03-132022-03-132016https://publica.fraunhofer.de/handle/publica/39805710.1109/ECCE.2016.7854828This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.enconference paper