Hanke, RandolfRandolfHankeFuchs, TheobaldTheobaldFuchsSalamon, MichaelMichaelSalamonZabler, SimonSimonZabler2022-03-052022-03-052016https://publica.fraunhofer.de/handle/publica/243789Since the 1970ies X-ray Computed Tomography (CT) has become a well-established and routinely used modality in modern diagnostic radiology (Hounsfield, 1973). Beyond that, since the late 1980ies, X-ray CT has emerged as a very important and wide spread tool in industrial inspection as well as in material sciences (Hanke, et al., 2008).enWerkstoffprüfungSimulationRöntgentechnikRöntgenquelleRöntgendetektorRekonstruktion / AlgorithmikPhysikMesssystemLebensmittelindustrielle CTindustrielle BVGussteileDefekterkennungCT-SystemeCT-BildqualitätComputer-Tomografie (CT)Computational ImagingArtefakt3D Bildverarbeitung3D2D621006X-Ray microtomography for materials characterizationbook article