Krone, T.T.KroneHung, L.D.L.D.HungJung, M.M.JungMertens, A.A.Mertens2022-03-132022-03-132016https://publica.fraunhofer.de/handle/publica/39709710.1109/EPE.2016.76955462-s2.0-849969103812-s2.0-84996910381In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.enconference paper