Under CopyrightHackel, SaschaSaschaHackelRennoch, AxelAxelRennoch2022-03-1423.10.20192019https://publica.fraunhofer.de/handle/publica/40538810.24406/publica-fhg-405388In IoT, quality engineering faces new challenges. For example, the system under test (SUT) vary from single IoT devices to highly dynamic IoT infrastructures and platforms. Consequently, test design techniques have to be able to deal with a high number of devices with open interfaces. Those devices are sensors, actuators, microcontrollers or gateways. Sometimes they are installed in harsh and unreliable environments. Primarily, devices like sensors and microcontrollers work under resource constrained conditions such as energy supply or network availability. Functional and non-functional aspects play an important role and need to be considered.entest automationIoTTTCN-3004presentation