Wolf, H.H.WolfGieser, H.H.GieserStadler, W.W.StadlerWilkening, W.W.Wilkening2022-03-032022-03-032004https://publica.fraunhofer.de/handle/publica/207483This paper describes a new test method called Capacitively Coupled Transmission Line Pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The cc-TLP results correlate well with the CDM data.en621journal article