Lottis, ChristianChristianLottisSprunck, SebastianSebastianSprunckSah, BikashBikashSahJung, MarcoMarcoJung2024-10-012025-05-272024-10-012024https://publica.fraunhofer.de/handle/publica/47587010.30420/5662624712-s2.0-85202024187While assessing the losses in Wide-Bandgap (WBG) devices in a Double-Pulse-Test (DPT), stringent requirements for high-fidelity probes have to be applied. The limited bandwidth of a probe has a significant influence on the measurement results due to its inherent delay and distortion effects that originate from its parasitic or discrete filter components. This paper proposes a technique to compensate for these influences by post-processing measured data based on the characteristics of the used probes. Instead of using a complex inverse transfer function of the probe, an average error compensation is developed and discussed for use in a DPT and validated based on circuit simulation.enDouble-Pulse-TestWide-Bandgapconference paper