Neske, E.E.NeskeBergmann, E.E.BergmannBachem, K.H.K.H.BachemKulmus, K.K.KulmusBachem, D.D.Bachem2022-03-082022-03-081985https://publica.fraunhofer.de/handle/publica/301904In a device for the continuous measurement of thickness of a material deposit produced on a bearer material by means of a coating machine, the deposit thickness on the measuring electrode (9) of a reference probe (50) is determined electrically by detecting the alternating current signal on the measuring electrode (9). The measuring electrode (9) is located between two metal housings (1) provided with inlet openings (4, 5) and is applied with opposite alternating currents shifted in phase by 180 degrees, the amplitudes of said alternating currents being adjusted at the start of measurement such that no signal occurs at the measuring electrode (9). The material deposit produced on the measuring electrode (9) located in the vicinity during the coating of a bearer material causes an offset of the electric field in the reference probe (50) and thus a measuring current in the measuring electrode (9) connected to an evaluation circuit.de608621patent1984-3401140