Krause, F.F.KrauseVoges, T.T.VogesRehme, F.F.RehmeDudek, R.R.DudekVogel, D.D.VogelFaust, W.W.Faust2022-03-092022-03-091994https://publica.fraunhofer.de/handle/publica/323059en621Reliability of epoxy Globtop in microelectronic assembliesconference paper