Glunz, Stefan W.Stefan W.GlunzBiro, DanielDanielBiroRein, StefanStefanReinWarta, WilhelmWilhelmWarta2022-03-032022-03-031999https://publica.fraunhofer.de/handle/publica/19590910.1063/1.370784en621697530Field-effect passivation of the SiO(2)-Si interfacejournal article