Statistical methods for the correction of tip convolution effects in STM imaging of nanometer size particles in metal-C:H films

Schiffmann, K.K.SchiffmannFryda, M.M.FrydaGoerigk, G.G.GoerigkLauer, R.R.LauerHinze, P.P.Hinze2022-03-032022-03-031996https://publica.fraunhofer.de/handle/publica/18911810.1016/S0304-3991(96)00086-1en667530Statistical methods for the correction of tip convolution effects in STM imaging of nanometer size particles in metal-C:H filmsjournal article