Under CopyrightSturm, LeonhardLeonhardSturmNebrich, L.L.NebrichNeumeier, K.K.NeumeierEisele, I.I.EiseleKutter, C.C.Kutter2022-03-1413.12.20192018https://publica.fraunhofer.de/handle/publica/40180310.24406/publica-fhg-401803enx-ray instrumentationlow-noise transistorsolid-state detector621Low power, low noise JFETs for room temperature X-ray detectorspresentation