Non-interferometric transient quantitative phase microscopy for ultrafast engineering

Horn, A.A.HornMingareev, I.I.MingareevWerth, A.A.WerthKachel, M.M.KachelBrenk, U.U.Brenk2022-03-042022-03-042008https://publica.fraunhofer.de/handle/publica/21655610.1007/s00339-008-4657-1en621Non-interferometric transient quantitative phase microscopy for ultrafast engineeringjournal article