Pretorius, A.A.PretoriusYamaguchi, T.T.YamaguchiSchowalter, M.M.SchowalterKröger, R.R.KrögerKübel, C.C.KübelHommel, D.D.HommelRosenauer, A.A.Rosenauer2022-03-102022-03-102005https://publica.fraunhofer.de/handle/publica/34949110.1007/3-540-31915-8_3en620660671Investigation of InxGa1-xN islands with electron microscopyconference paper