Kalkowski, GerhardGerhardKalkowskiRisse, S.S.RissePeschel, ThomasThomasPeschel2022-03-082022-03-082012https://publica.fraunhofer.de/handle/publica/309842The holding element has electrodes (4,4') which are formed on the surface of a base portion (1) and are covered by the dielectric layer. The dielectric layer is used as a support for the to-be-processed items. The base portion is formed of carbon fiber reinforced silicon carbide (SiC). The carbon fibers embedded in the SiC are arranged and/or oriented in one plane which is aligned parallel to the support plane for the to-be-processed items. The base portion comprises approximately isotropic thermal expansion characteristics, at room temperature.de620Elektrostatisches HalteelementElectrostatic holding element for processing items e.g. wafer, has base portion made of carbon fibers arranged and/or oriented in plane parallel to support plane for items, which comprises isotropic thermal expansion characteristicspatent102012002646