Reliablility of SnPb and Pb-Free Flip-Chips under Different Test Conditions

Spraul, M.M.SpraulNüchter, W.W.NüchterMöller, A.A.MöllerWunderle, B.B.WunderleMichel, B.B.Michel2022-03-042022-03-042007https://publica.fraunhofer.de/handle/publica/215002en621Reliablility of SnPb and Pb-Free Flip-Chips under Different Test Conditionsjournal article