Infrared reflection studies of ceramics: characterization of SiC layers on graphite substrates

Hopfe, V.V.HopfeGraehlert, W.W.GraehlertBrennfleck, K.K.BrennfleckKorte, E.H.E.H.KorteTheiß, W.W.Theiß2022-03-032022-03-031993https://publica.fraunhofer.de/handle/publica/18303210.1007/BF00321391en667621671Infrared reflection studies of ceramics: characterization of SiC layers on graphite substratesjournal article