Under CopyrightSchubert, Martin C.Martin C.SchubertIsenberg, JörgJörgIsenbergRein, StefanStefanReinBermejo, S.S.BermejoGlunz, Stefan W.Stefan W.GlunzWarta, WilhelmWilhelmWarta2022-03-1012.10.20122005https://publica.fraunhofer.de/handle/publica/34959110.24406/publica-fhg-349591Injection dependent lifetime measurements are often severely affected by trapping effects, resulting in an anomalous increase of lifetime under low-injection conditions. Carrier Density Imaging (CDI) measurements are presented where trapping effects are clearly present. Two different correction methods are proposed, based on the modeling of the injection dependent data. A model for CDI measurements, based on the Hornbeck-Haynes model is proposed as well as a bias-light correction adapted to CDI. Finally, a modification of the CDI setup is presented which allows to suppress trapping effects very efficiently. It is based on an additional irradiation with sub-bandgap light which is assumed to deplete trap levels resulting in trap-free lifetime measurements. A comparison of the carrier lifetimes resulting from these methods shows excellent correlation.en621697conference paper