Meyendorf, N.N.MeyendorfAltpeter, I.I.AltpeterNetzelmann, U.U.NetzelmannRösner, H.H.RösnerHoffmann, J.J.Hoffmann2022-03-092022-03-092000https://publica.fraunhofer.de/handle/publica/335629Ferromagnetic layers and layer systems are of extraordinary interest for sensor and actuator applications as well as for new microeletronic storage media and electronic components. This article focuses on methods for non-destructive characterization of such layers. Bearing in mind the general application for non-destructive characterization methods, this article will focus primarily on photothermic and electromagnetic techniques.ennondestructive testingBarkhausen noiseeddy currentthermographythin filmphotothermal methodferromagnetic potential noisemagnetism620658670conference paper