Poshtan, E.A.E.A.PoshtanSilber, C.C.SilberRzepka, SvenSvenRzepkaMichel, BerndBerndMichelWunderle, BernhardBernhardWunderle2022-03-042022-03-042014https://publica.fraunhofer.de/handle/publica/238379enAn accelerated interfacial characterization method for microelectronic packages under automotive testing conditions - methodology and sample preparationbook article