Krimi, SoufieneSoufieneKrimiKlier, JensJensKlierEllrich, FrankFrankEllrichJonuscheit, JoachimJoachimJonuscheitUrbansky, R.R.UrbanskyBeigang, RenéRenéBeigangFreymann, Georg vonGeorg vonFreymann2022-03-132022-03-132015https://publica.fraunhofer.de/handle/publica/39094510.1109/IRMMW-THz.2015.7327474We present a novel numerical approach to decrease the limits of the minimum paint thickness measurements of individual layers in multilayered structures using terahertz pulsed technique in reflection geometry. This method combines the benefits of model-based material parameters extraction, a generalized transfer matrix method, and an evolutionary optimization algorithm. The proposed approach has been successfully applied to resolve individual layer thicknesses down to 5 mm in multilayered automotive paint samples.en621conference paper