Schubert, A.A.SchubertMichel, B.B.MichelKämpfe, B.B.Kämpfe2022-03-092022-03-091996https://publica.fraunhofer.de/handle/publica/326934A new X-ray method for stress analysis is described. For data collection a two-dimensional detector like an imaging plate was used. Laser stimulated fluorescence imaging plates are available for a couple of years now and were used mainly in single crystal analysis. In contrast to normal counters a good resolution in both counter directions is given and should be used for stress analysis.enelastic deformationinternal stresslaser beam applicationssteelstress analysisstress measurementtexturex-ray diffractionx-ray topography621conference paper