Wohlgemuth, O.O.WohlgemuthRodwell, M.J.W.M.J.W.RodwellReuter, R.R.ReuterBraunstein, J.J.BraunsteinSchlechtweg, M.M.Schlechtweg2022-03-092022-03-091999https://publica.fraunhofer.de/handle/publica/33247210.1109/MWSYM.1999.780283Active probes for 2-port on-wafer network analysis within 70-230 GHz are presented. The probe contains an integrated circuit based on nonlinear transmission lines (NLTL) which has all elements of an S-parameter test set. 2-port measurements with these active probes were carried out. Compared to earlier act probe systems, measurement accuracy is greatly improved.ennetwork analysisNetzwerkanalyseS-parameter measurementS-Parameter-Messung621667conference paper