CC BY 4.0Wagner, LukasLukasWagnerSchygulla, PatrickPatrickSchygullaHerterich, Jan PhilippJan PhilippHerterichElshamy, MohamedMohamedElshamyBogachuk, DmitryDmitryBogachukZouhair, SalmaSalmaZouhairMastroianni, SimoneSimoneMastroianniWürfel, UliUliWürfelLiu, YuhangYuhangLiuZakeeruddin, Shaik M.Shaik M.ZakeeruddinGrätzel, MichaelMichaelGrätzelHinsch, AndreasAndreasHinschGlunz, StefanStefanGlunz2022-09-272022-09-272022Note-ID: 000093E2https://publica.fraunhofer.de/handle/publica/427010https://doi.org/10.24406/h-42701010.1016/j.matt.2022.05.02410.24406/h-4270102-s2.0-85133254590The photocurrent density-voltage (J(V)) curve is the fundamental characteristic to assess opto-electronic devices, in particular solar cells. However, it only yields information on the performance integrated over the entire active device area. Here, a method to determine spatially resolved photocurrent images by voltage-dependent photoluminescence microscopy is derived from basic principles. The opportunities and limitations of the approach are studied by the investigation of III-V and perovskite solar cells. This approach allows the real-time assessment of the microscopically resolved local J(V) curve and the steady-state Jsc as well as transient effects. In addition, the measurement contains information on local charge extraction and interfacial recombination. This facilitates the identification of regions of non-ideal charge extraction and enables linking these to the processing conditions. The proposed technique highlights that, combined with potentiostatic measurements, luminescence microscopy can be a powerful tool for the assessment of performance losses and the improvement of solar cells.encharge extractionIII-V solar cellslocal analysisMAP3: Understandingperovskite solar cellsphotocurrent imagingphotoluminescence imagingshort-circuit currentphotoluminescencejournal article