Under CopyrightHutzler, AndreasAndreasHutzlerMatthus, C.D.C.D.MatthusDolle, C.C.DolleRommel, MathiasMathiasRommelJank, M.P.M.M.P.M.JankSpiecker, E.E.SpieckerFrey, L.L.Frey2022-03-1424.10.20182018https://publica.fraunhofer.de/handle/publica/40188210.24406/publica-fhg-401882engraphene oxidesilicondielectric optical stackreflectivitymodellingdetectionlayer counting670620530Large-area layer counting of 2D materials via visible reflection spectroscopyposter