Hutzler, AndreasAndreasHutzlerFritsch, BirkBirkFritschMatthus, Christian DavidChristian DavidMatthusJank, MichaelMichaelJankRommel, MathiasMathiasRommel2023-08-162023-08-162023https://publica.fraunhofer.de/handle/publica/44831610.1038/s41598-023-28605-02-s2.0-8514681238236697492The original version of this Article contained an error in Equation 1. (Formula Presented.).now reads:(Formula Presented.)As a result, Equation 2 was incorrect.(Formula Presented.).now reads:(Formula Presented.).The original Article has been corrected.enAuthor Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy (Scientific Reports, (2020), 10, 1, (13676), 10.1038/s41598-020-70580-3)erratum