Approaches for the reduction of the influence of parasitic capacitances on local IV characteristics for conductive AFM

Under CopyrightRommel, MathiasMathiasRommelJambreck, Joachim D.Joachim D.JambreckMurakami, KatsuhisaKatsuhisaMurakamiLemberger, MartinMartinLembergerRichter, ChristophChristophRichterWeinzierl, PhilipPhilipWeinzierlBauer, A.J.A.J.BauerFrey, LotharLotharFrey2022-03-1119.7.20122012https://publica.fraunhofer.de/handle/publica/37616310.24406/publica-fhg-376163entunneling AFMTUNAconductive AFMcAFMparasitic capacitancedisplacement currentshielded AFM probes670620530Approaches for the reduction of the influence of parasitic capacitances on local IV characteristics for conductive AFMpresentation