Apostolidis, D.D.ApostolidisTepelmann, D.D.TepelmannRennoch, A.A.RennochVouffo, A.A.Vouffo2022-03-102022-03-102005https://publica.fraunhofer.de/handle/publica/349902en004Use of TTCN-3 for the development of SIGTRAN testsconference paper