Under CopyrightHerrmann, MichaelMichaelHerrmannWeyrauch, HubertHubertWeyrauch2022-03-149.11.20192019https://publica.fraunhofer.de/handle/publica/40550510.24406/publica-fhg-405505The surface morphology of HMX grades (euhedral and subhedral) was investigated by means of atomic force microscopy and confocal microscopy. The crystals revealed quite different topographic structures, including step-shaped surfaces, outgrowths from the crystal bulk, fine particles intergrown to the bulk, surface roughness and in case of a type B grade HMX a highly defective surface layer. Stochastic methods were applied to quantify surface parameters such as the density and mean height of outgrowths/particles and the mean depth of the porous surface layer.en660HMX crystal topography investigated by means of atomic force microscopy and confocal microscopyconference paper